Open AccessEllipsometry in the Study of Dynamic Material Properties
Author(s) -
A. W. Obst,
K.R. Alrick,
William W. Anderson,
K. Boboridis,
W. T. Buttler,
S. K. Lamoreaux,
B. R. Marshall,
Stefanie L. Montgomery,
J. R. Payton,
Mark D. Wilke
Publication year - 2002
Publication title -
aip conference proceedings
Language(s) - English
Resource type - Conference proceedings
SCImago Journal Rank - 0.177
H-Index - 75
eISSN - 1551-7616
pISSN - 0094-243X
DOI - 10.1063/1.1483765
Subject(s) - emissivity , polarimetry , ellipsometry , polarimeter , explosive material , materials science , ejecta , infrared , optics , physics , thin film , nanotechnology , chemistry , organic chemistry , supernova , scattering , quantum mechanics
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