Tunable negative differential resistance controlled by spin blockade in single-electron transistors
Author(s) -
M. Ciorga,
Michel Pioro-Ladrière,
P. Zawadzki,
Paweł Hawrylak,
A. S. Sachrajda
Publication year - 2002
Publication title -
applied physics letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.182
H-Index - 442
eISSN - 1077-3118
pISSN - 0003-6951
DOI - 10.1063/1.1459489
Subject(s) - coulomb blockade , condensed matter physics , electron , heterojunction , transistor , spin (aerodynamics) , biasing , materials science , relaxation (psychology) , spin transistor , optoelectronics , spin polarization , voltage , physics , spin hall effect , quantum mechanics , thermodynamics , psychology , social psychology
The single-electron transistors containing a few electrons and spin polarized source and drain contacts were formed in GaAs/GaAlAs heterojunctions using metallic gates. Coulomb blockade measurements reveal well-defined regimes where a decrease in the current is observed with increasing bias. We establish that the origin of the negative regime is the spin-polarized detection of electrons combined with a long spin relaxation time in the dot.Peer reviewed: NoNRC publication: Ye
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