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Monolithic I-beam crystal monochromator
Author(s) -
John Bagnasco,
Douglas G. Van Campen,
T. A. Rabedeau
Publication year - 2002
Publication title -
review of scientific instruments
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.605
H-Index - 165
eISSN - 1089-7623
pISSN - 0034-6748
DOI - 10.1063/1.1445820
Subject(s) - flange , materials science , monochromator , beam (structure) , deformation (meteorology) , crystal (programming language) , finite element method , residual stress , stress (linguistics) , optics , fixture , structural engineering , composite material , mechanical engineering , optoelectronics , computer science , physics , engineering , wavelength , linguistics , philosophy , programming language
Curved crystal, focusing monochromators featuring cubed-root thickness profiles typically employ side-clamped cooling to reduce thermally induced overall bend deformation of the crystal. While performance is improved, residual bend deformation is often an important limiting factor in the monochromator performance. A slightly asymmetric "I-beam" crystal cross section with cubed-root flange profiles has been developed to further reduce this effect. Physical motivation, finite-element modeling evaluation and performance characteristics of this design are discussed. Reduction of high mounting stress at the fixed end of the crystal required the soldering of an Invar support fixture to the crystal. Detailed descriptions of this process along with its performance characteristics are also presented.

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