High critical current densities in superconducting MgB2 thin films
Author(s) -
SeungHyun Moon,
Jinyoung Yun,
H. N. Lee,
Jeong-Il Kye,
H. G. Kim,
Woo Kyung Chung,
B. Oh
Publication year - 2001
Publication title -
applied physics letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.182
H-Index - 442
eISSN - 1077-3118
pISSN - 0003-6951
DOI - 10.1063/1.1407854
Subject(s) - thin film , superconductivity , annealing (glass) , scanning electron microscope , materials science , magnesium diboride , electron beam physical vapor deposition , diffraction , boron , analytical chemistry (journal) , carbon film , critical current , condensed matter physics , nanotechnology , optics , chemistry , composite material , physics , organic chemistry , chromatography
Superconducting MgB2 thin films were prepared on Al2O3(0001) and MgO(100)substrates. Boron thin films were deposited by the electron-beam evaporationfollowed by post-annealing process with magnesium. Proper post annealingconditions were investigated to grow good superconducting MgB2 thin films. TheX-ray diffraction patterns showed randomly orientated growth of MgB2 phase inour thin films. The surface morphology was examined by scanning electronmicroscope (SEM) and atomic force microscope (AFM). Critical current density(Jc) measured by transport method was about 10^7 A/cm^2 at 15 K, andsuperconducting transition temperature (Tc) was ~ 39 K in the MgB2 thin filmson Al2O3.Comment: 13 pages, 4 figures, submitted on Apr. 4, 2001, only one pdf fil
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