Open AccessErratum: “Robustness of ultrathin aluminum oxide dielectrics on Si(001)” [Appl. Phys. Lett. 78, 2670 (2001)]
Author(s) -
M. Copel,
E. Cartier,
E. P. Gusev,
S. Guha,
N. A. Bojarczuk,
M. Poppeller
Publication year - 2001
Publication title -
applied physics letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.182
H-Index - 442
eISSN - 1077-3118
pISSN - 0003-6951
DOI - 10.1063/1.1380681
Subject(s) - aluminum oxide , dielectric , materials science , robustness (evolution) , aluminium , oxide , composite material , optoelectronics , condensed matter physics , nanotechnology , chemistry , physics , metallurgy , biochemistry , gene
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