Erratum: “Scanning impedance microscopy of electroactive interfaces” [Appl. Phys. Lett. 78, 1306 (2001)]
Author(s) -
Sergei V. Kalinin,
Dawn A. Bonnell
Publication year - 2001
Publication title -
applied physics letters
Language(s) - Uncategorized
Resource type - Journals
SCImago Journal Rank - 1.182
H-Index - 442
eISSN - 1077-3118
pISSN - 0003-6951
DOI - 10.1063/1.1379072
Subject(s) - electrical impedance , microscopy , materials science , condensed matter physics , nanotechnology , optics , physics , quantum mechanics
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