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Electronic properties of mechanically induced kinks in single-walled carbon nanotubes
Author(s) -
Dolores Bozovic,
Marc Bockrath,
Jason H. Hafner,
Charles M. Lieber,
Hongkun Park,
M. Tinkham
Publication year - 2001
Publication title -
applied physics letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.182
H-Index - 442
eISSN - 1077-3118
pISSN - 0003-6951
DOI - 10.1063/1.1377316
Subject(s) - carbon nanotube , materials science , buckle , electron microscope , nanotechnology , mechanical properties of carbon nanotubes , metal , fermi level , atomic force microscopy , transmission electron microscopy , optoelectronics , electron , condensed matter physics , composite material , nanotube , optics , metallurgy , physics , quantum mechanics
We have used an atomic-force microscope tip to mechanically buckle single-walled carbon nanotubes. The resistance of the induced defects ranged from 10 to 100 kΩ and varied with the local Fermi level, as determined by scanned-gate microscopy. By forming two closely spaced defects on metallic nanotubes, we defined quantum dots less than 100 nm in length. These devices exhibited single-electron charging behavior at temperatures up to ∼165 K.

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