Mechanical deformation of InP and GaAs by spherical indentation
Author(s) -
J. E. Bradby,
J. S. Williams,
J. WongLeung,
Michael V. Swain,
Paul Munroe
Publication year - 2001
Publication title -
applied physics letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.182
H-Index - 442
eISSN - 1077-3118
pISSN - 0003-6951
DOI - 10.1063/1.1372207
Subject(s) - indentation , materials science , transmission electron microscopy , composite material , dislocation , cracking , slip (aerodynamics) , residual stress , lüders band , deformation (meteorology) , discontinuity (linguistics) , nanoindentation , crystallography , mineralogy , geology , nanotechnology , chemistry , mathematical analysis , physics , mathematics , thermodynamics
The mechanical deformation by spherical indentation of both crystalline InP and GaAs was characterized using cross-sectional transmission electron microscopy (XTEM) and atomic force microscopy. All load–unload curves show a discontinuity (or “pop in”) during loading. Slip bands oriented along {111} planes are visible in XTEM micrographs from residual indentations in both materials and no evidence of any phase transformations was found. Higher load indentations (35 mN for InP and 50 mN for GaAs) also revealed subsurface cracking. In contrast no cracking was found beneath a 25 mN InP indent although the hardness and modulus data are almost identical to those of the cracked sample. The subsurface cracks are thought to be nucleated by high stress concentrations caused by dislocation pileup.
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