Origin of electric field enhancement in field emission from amorphous carbon thin films
Author(s) -
J. David Carey,
R. D. Forrest,
S. Ravi P. Silva
Publication year - 2001
Publication title -
applied physics letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.182
H-Index - 442
eISSN - 1077-3118
pISSN - 0003-6951
DOI - 10.1063/1.1366369
Subject(s) - thin film , electric field , field electron emission , amorphous solid , materials science , carbon film , amorphous carbon , carbon fibers , field (mathematics) , engineering physics , condensed matter physics , optoelectronics , nanotechnology , physics , chemistry , electron , composite material , crystallography , mathematics , pure mathematics , quantum mechanics , composite number
The observation of electron emission from amorphous carbon thin films at low applied electric fields is explained in terms of an enhancement of the field brought about by dielectric inhomogeneities within the film. These inhomogeneities originate from the differences between conductive, spatially localized sp2 C clusters surrounded by a more insulating sp3 matrix. By a more complete understanding of the concentration and distribution of the clusters, a generic model for field emission from amorphous carbon thin films can be developed. Extensions of this model to explain the emission properties of carbon nanotubes and carbon nanocomposite materials are also presented
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