Open AccessScanning electron microscopy: Present capability, future improvements and potential replacements
Author(s) -
David C. Joy
Publication year - 2001
Publication title -
aip conference proceedings
Language(s) - English
Resource type - Conference proceedings
SCImago Journal Rank - 0.177
H-Index - 75
eISSN - 1551-7616
pISSN - 0094-243X
DOI - 10.1063/1.1354456
Subject(s) - metrology , dominance (genetics) , computer science , dimensional metrology , key (lock) , quantum metrology , nanotechnology , optics , systems engineering , materials science , engineering , physics , computer security , biochemistry , chemistry , gene , quantum discord , quantum mechanics , quantum entanglement , quantum
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