Open AccessMeasurement of the dielectric constant of thin films using goniometric time-domain spectroscopy
Author(s) -
Ming Li
Publication year - 2001
Publication title -
aip conference proceedings
Language(s) - English
Resource type - Conference proceedings
SCImago Journal Rank - 0.177
H-Index - 75
eISSN - 1551-7616
pISSN - 0094-243X
DOI - 10.1063/1.1354430
Subject(s) - materials science , brewster's angle , dielectric , goniometer , optics , wafer , terahertz radiation , terahertz time domain spectroscopy , silicon , substrate (aquarium) , optoelectronics , permittivity , thin film , terahertz spectroscopy and technology , brewster , physics , oceanography , nanotechnology , geology
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