Open AccessQuantitative analysis of copper contamination in silicon by surface photovoltage minority carrier lifetime analysis
Author(s) -
Deepak A. Ramappa
Publication year - 2001
Publication title -
aip conference proceedings
Language(s) - English
Resource type - Conference proceedings
SCImago Journal Rank - 0.177
H-Index - 75
eISSN - 1551-7616
pISSN - 0094-243X
DOI - 10.1063/1.1354400
Subject(s) - copper , silicon , surface photovoltage , carrier lifetime , materials science , annealing (glass) , contamination , analytical chemistry (journal) , crystalline silicon , dissociation (chemistry) , chemistry , metallurgy , spectroscopy , ecology , physics , chromatography , quantum mechanics , biology
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