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Systematic study of the normal and pumped state of high efficiency diamond particle detectors grown by chemical vapor deposition
Author(s) -
M. Marinelli,
E. Milani,
A. Paoletti,
A. Tucciarone,
G. VeronaRinati,
M. Angelone,
M. Pillon
Publication year - 2001
Publication title -
journal of applied physics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.699
H-Index - 319
eISSN - 1089-7550
pISSN - 0021-8979
DOI - 10.1063/1.1332805
Subject(s) - chemical vapor deposition , diamond , materials science , detector , grain size , methane , particle (ecology) , particle detector , deposition (geology) , grain boundary , analytical chemistry (journal) , optoelectronics , optics , chemistry , microstructure , composite material , physics , paleontology , oceanography , organic chemistry , chromatography , sediment , biology , geology
The efficiency and charge collection distance (CCD) of nuclear particle detectors based on high quality diamond films grown by chemical vapor deposition (CVD) have been systematically studied as a function of the methane content in the growth gas mixture and for varying film thickness. The effects of preirradiation with β particles (pumping) have been thoroughly studied. The results fully support a recently proposed model [Marinelli et al., Appl. Phys. Lett. 75, 3216 (1999)] discussing the role of in-grain defects and grain boundaries in determining the charge collection spectra of CVD diamond films both in the normal and in the pumped state. The model allows us to quantitatively explain the dependence of CCD and efficiency on film thickness, giving a microscopic picture of the effects of preirradiation with ionizing radiation in CVD diamond films. The highest average CCD obtained is 145 μm in a 160 μm thick detector (corresponding to about 50% average efficiency), while the maximum value (about 70% efficiency) is close to 370 μm. In addition, CCD is shown to be higher than film thickness and to monotonically increase with thickness, indicating margins for further improvements. © 2001 American Institute of Physics

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