Erratum: “Effect of size and roughness on light transmission in a Si/SiO2 waveguide: Experiments and model” [Appl. Phys. Lett. 77, 1617 (2000)]
Author(s) -
Kevin C. Lee,
Desmond R. Lim,
Hsin-Chiao Luan,
Anu Agarwal,
James Foresi,
Lionel C. Kimerling
Publication year - 2000
Publication title -
applied physics letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.182
H-Index - 442
eISSN - 1077-3118
pISSN - 0003-6951
DOI - 10.1063/1.1320897
Subject(s) - surface finish , surface roughness , transmission (telecommunications) , waveguide , materials science , condensed matter physics , optics , physics , optoelectronics , composite material , telecommunications , computer science
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