Significant photoinduced refractive index change observed in porous silicon Fabry–Pérot resonators | Zendy

Morio Takahashi | Zendy; Y. Toriumi | Zendy; Takahiro Matsumoto | Zendy; Yasuaki Masumoto | Zendy; Nobuyoshi Koshida | Zendy

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Significant photoinduced refractive index change observed in porous silicon Fabry–Pérot resonators

Author(s) -

Morio Takahashi,

Y. Toriumi,

Takahiro Matsumoto,

Yasuaki Masumoto,

Nobuyoshi Koshida

Publication year - 2000

Publication title -

applied physics letters

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 1.182

H-Index - 442

eISSN - 1077-3118

pISSN - 0003-6951

DOI - 10.1063/1.126279

Subject(s) - fabry–pérot interferometer , porous silicon , materials science , refractive index , resonator , silicon , optoelectronics , optics , wavelength , silicon photonics , optical power , laser , physics

It is shown that a porous silicon Fabry–Pe´rot resonator device exhibits a significant nonlinearoptical transmission behavior at wavelengths in the near-infrared region. The input–output(transmission–incident power) response curve shows superlinear or sublinear behavior dependenton excitation wavelengths around the resonant position. These characteristics are interpreted as aresult of nonlinear refractive index change, including by enhanced optical power in the Fabry–Pe´rotcavity configuration and carrier accumulation in silicon nanocrystallites. The result leads to furtherprogress of nanocrystalline silicon into functional photonic device applications

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