The electrical behavior of Pt3In7 and NiIn contacts to p-GaN
Author(s) -
D. B. Ingerly,
Y. A. Chang,
Yuan Yuan Chen
Publication year - 1999
Publication title -
applied physics letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.182
H-Index - 442
eISSN - 1077-3118
pISSN - 0003-6951
DOI - 10.1063/1.124168
Subject(s) - ohmic contact , contact resistance , annealing (glass) , intermetallic , materials science , electrical contacts , atomic force microscopy , analytical chemistry (journal) , nanotechnology , metallurgy , optoelectronics , chemistry , alloy , layer (electronics) , chromatography
This material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder
Accelerating Research
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom
Address
John Eccles HouseRobert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom