Cathodoluminescence enhancement in porous silicon cracked in vacuum | Zendy

J. Rams | Zendy; Bianchi Méndez | Zendy; G. Crăciun | Zendy; R. Plugaru | Zendy; J. Piqueras | Zendy

AI Assistant Blog Pricing

Home ZAIA Blog

Open Access

Cathodoluminescence enhancement in porous silicon cracked in vacuum

Author(s) -

J. Rams,

Bianchi Méndez,

G. Crăciun,

R. Plugaru,

J. Piqueras

Publication year - 1999

Publication title -

applied physics letters

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 1.182

H-Index - 442

eISSN - 1077-3118

pISSN - 0003-6951

DOI - 10.1063/1.123669

Subject(s) - cathodoluminescence , materials science , porous silicon , silicon , substrate (aquarium) , porosity , cathode ray , layer (electronics) , optics , optoelectronics , electron , luminescence , composite material , physics , geology , oceanography , quantum mechanics

An increase of the cathodoluminescence (CL) signal of porous silicon (PS) cracked in vacuum of up to three orders of magnitude has been achieved. Under high electron-beam currents, the samples cracked in interconnected pieces of tens of microns, exposing new surfaces to the electron beam. This treatment enhances the radiative intensity in PS associated with a broadband peaked at 720 nm, which is highly stable while the sample is kept in vacuum. Cross-sectional CL observations show that most of the light is generated in the top surface of the porous layer. The spectral depth dependence of the emitted light reveals a relatively weak blue emission in the region closer to the substrate

The content you want is available to Zendy users.

Already have an account? Click here to sign in.

Having issues? You can contact us here

Accelerating Research