Optical force microscopy with silicone rubber waveguides | Zendy

Stephan Herminghaus | Zendy; Marc Riedel | Zendy; P. Leǐderer | Zendy; Martin Bastmeyer | Zendy; Claudia Stürmer | Zendy

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Optical force microscopy with silicone rubber waveguides

Author(s) -

Stephan Herminghaus,

Marc Riedel,

P. Leǐderer,

Martin Bastmeyer,

Claudia Stürmer

Publication year - 1997

Publication title -

applied physics letters

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 1.182

H-Index - 442

eISSN - 1077-3118

pISSN - 0003-6951

DOI - 10.1063/1.119292

Subject(s) - silicone rubber , planar , waveguide , materials science , optics , optical force , resolution (logic) , microscopy , natural rubber , optical microscope , total internal reflection , optoelectronics , composite material , scanning electron microscope , physics , optical tweezers , computer graphics (images) , artificial intelligence , computer science

A simple technique is described for optically imaging the lateral distribution of normal forces exerted onto a flat surface. It is based on the detuning of a silicone rubber planar waveguide by the forces to be investigated. The method is demonstrated by imaging the contact line force of a sessile water droplet on the surface, with a force resolution better than μN. It is shown that the lateral resolution may be much better than the decay length of the waveguide modes used.

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