A fiber-mounted, micromachined photoconductive probe with 15 nV/Hz1/2 sensitivity
Author(s) -
R. Lai,
Jiunn-Ren Hwang,
J. Nees,
Theodore B. Norris,
J.F. Whitaker
Publication year - 1996
Publication title -
applied physics letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.182
H-Index - 442
eISSN - 1077-3118
pISSN - 0003-6951
DOI - 10.1063/1.117452
Subject(s) - materials science , photoconductivity , optoelectronics , optical fiber , picosecond , laser , detector , electronic circuit , optics , sensitivity (control systems) , electronic engineering , electrical engineering , physics , engineering
We report the performance of a micromachined, photoconductive‐sampling probe that is fabricated on low‐temperature‐grown GaAs and mounted on a single‐mode optical fiber. The epitaxial probe has a temporal resolution of 3.5 ps, a spatial resolution of 7 μm, and a sensitivity of 15 nV/(Hz)1/2 when integrated with a high impedance, junction field‐effect transistor source follower. The fiber, which couples short laser pulses to the interdigitated detector pattern on the probe, also provides flexible support and mobility. The probe’s compact cross section makes it ideal for applications as an internal‐node, picosecond‐response, photoconductive sampling probe or wave form launcher for test and characterization of integrated circuits. © 1996 American Institute of Physics
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