Nitrogen containing hydrogenated amorphous carbon for thin-film field emission cathodes
Author(s) -
G.A.J. Amaratunga,
S. Ravi P. Silva
Publication year - 1996
Publication title -
applied physics letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.182
H-Index - 442
eISSN - 1077-3118
pISSN - 0003-6951
DOI - 10.1063/1.116173
Subject(s) - field electron emission , anode , cathode , materials science , current density , amorphous carbon , carbon fibers , amorphous solid , analytical chemistry (journal) , nitrogen , electric field , electrode , electron , chemistry , composite material , crystallography , physics , organic chemistry , quantum mechanics , chromatography , composite number
Field emission measurements using 0.3 μm thick nitrogen containing hydrogenated amorphous carbon films (a‐C:H:N) on n++‐Si cathodes are reported. Onset emission fields as low as 4 V μm−1 have been obtained using a flat plate anode configuration. Uniform emission is observed over the entire cathode area at current densities below 7×10−2 mA cm−2. At higher current density preferential emission from spots is observed. The spot emission is imaged using the ITO coated plate anode. A model based on the a‐C:H:N acting as a space charge interlayer on the n++‐Si is proposed to explain the emission at low electric fields.
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