Open AccessFiltered x-ray diode diagnostics fielded on the Z accelerator for source power measurements
Author(s) -
G. A. Chandler,
C. Deeney,
M. E. Cuneo,
D. L. Fehl,
J. McGurn,
R. B. Spielman,
J. Torres,
J. L. McKenney,
J. A. Mills,
K. W. Struve
Publication year - 1999
Publication title -
review of scientific instruments
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.605
H-Index - 165
eISSN - 1089-7623
pISSN - 0034-6748
DOI - 10.1063/1.1149355
Subject(s) - physics , detector , optics , diode , radiation flux , sensitivity (control systems) , radiation , flux (metallurgy) , particle detector , particle accelerator , plasma diagnostics , optoelectronics , materials science , nuclear physics , beam (structure) , plasma , engineering , electronic engineering , metallurgy
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