Erratum: ‘‘Calibration of atomic-force microscope tips’’ [Rev. Sci. Instrum. 64, 1868 (1993)]
Author(s) -
Jeffrey L. Hutter,
John Bechhoefer
Publication year - 1993
Publication title -
review of scientific instruments
Language(s) - Uncategorized
Resource type - Journals
SCImago Journal Rank - 0.605
H-Index - 165
eISSN - 1089-7623
pISSN - 0034-6748
DOI - 10.1063/1.1144449
Subject(s) - calibration , atomic force microscopy , optics , materials science , physics , atomic physics , nanotechnology , quantum mechanics
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