Open AccessUsing a straightness reference in obtaining more accurate surface profiles from a long trace profiler
Author(s) -
Steve C. Irick,
Wayne R. McKinney,
David L. Lunt,
Peter Z. Takacs
Publication year - 1992
Publication title -
review of scientific instruments
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.605
H-Index - 165
eISSN - 1089-7623
pISSN - 0034-6748
DOI - 10.1063/1.1143036
Subject(s) - trace (psycholinguistics) , optics , interference (communication) , wavelength , synchrotron , materials science , remote sensing , geology , computer science , physics , telecommunications , philosophy , linguistics , channel (broadcasting)
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