Measurement under pressure of thermoelectric power along the thickness of a thin specimen
Author(s) -
S. Ramasesha,
Anil Kumar Singh
Publication year - 1991
Publication title -
review of scientific instruments
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.605
H-Index - 165
eISSN - 1089-7623
pISSN - 0034-6748
DOI - 10.1063/1.1142504
Subject(s) - materials science , perpendicular , thermoelectric effect , seebeck coefficient , thin film , power (physics) , composite material , thermal conductivity , nanotechnology , geometry , thermodynamics , physics , mathematics
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