Time-of-flight spectrometer for an ECR ion source | Zendy

D.R. Whaley | Zendy; T. Goodman | Zendy; W. D. Getty | Zendy

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Time-of-flight spectrometer for an ECR ion source

Author(s) -

D.R. Whaley,

T. Goodman,

W. D. Getty

Publication year - 1989

Publication title -

review of scientific instruments

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.605

H-Index - 165

eISSN - 1089-7623

pISSN - 0034-6748

DOI - 10.1063/1.1140438

Subject(s) - spectrometer , ion , time of flight , physics , atomic physics , amplifier , ion source , materials science , optics , optoelectronics , cmos , quantum mechanics

A time‐of‐flight ion spectrometer using electrostatic grids for ion gating is described. The spectrometer was built to monitor the charge state distribution of endloss ions passing from the midplane region of an ECR‐heated, simple magnetic‐mirror plasma experiment. Design considerations of the spectrometer are presented as well as the gating pulse circuit and signal amplifier circuit. An example of a time‐averaged spectrum is included to illustrate the achievable resolution of the spectrometer. Also a method is described to determine the ion energy distribution of a given charge state in the ion endloss

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