Audiofrequency measurement of JFET noise versus temperature in a high-impedance preamplifier | Zendy

S. R. Klein | Zendy; W. R. Innes | Zendy; John C. Price | Zendy

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Audiofrequency measurement of JFET noise versus temperature in a high-impedance preamplifier

Author(s) -

S. R. Klein,

W. R. Innes,

John C. Price

Publication year - 1985

Publication title -

review of scientific instruments

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.605

H-Index - 165

eISSN - 1089-7623

pISSN - 0034-6748

DOI - 10.1063/1.1138531

Subject(s) - preamplifier , jfet , noise (video) , y factor , capacitance , noise temperature , amplifier , johnson–nyquist noise , materials science , electrical impedance , low noise amplifier , atmospheric temperature range , output impedance , acoustics , optoelectronics , physics , detector , transistor , computer science , optics , field effect transistor , phase noise , electrode , voltage , cmos , artificial intelligence , image (mathematics) , quantum mechanics , meteorology

We describe a high‐impedance audiofrequency preamplifier and present audiofrequency noise spectra for 2N4416 and U311 JFETs in a temperature range from room temperature to 80 K. It is found that optimum noise performance is obtained at −140°C. We present an analysis of some of the sources of noise. Amplifier input capacitance is also measured and discussed.

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