A capacitance-based micropositioning system for x-ray rocking curve measurements
Author(s) -
G. L. Miller,
R.A. Boie,
P. L. Cowan,
J. A. Golovchenko,
R. W. Kerr,
D. A. Robinson
Publication year - 1979
Publication title -
review of scientific instruments
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.605
H-Index - 165
eISSN - 1089-7623
pISSN - 0034-6748
DOI - 10.1063/1.1136010
Subject(s) - capacitance , x ray , materials science , optics , physics , electrode , quantum mechanics
Certain types of x-ray experiments require very precise angular positioning of crystals in the vicinity of the Bragg reflection condition. A system applicable to some measurement of this type is described which achieves a long-term angular stability of approximately 10(-7) radians, coupled with a linear angular readout. This is achieved through a novel capacitance sensing system which provides angle measurement, together with the use of an auxilliary servo loop based on the Bragg condition to ensure long-term overall angular stability.
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