Erratum: ‘‘Time dependent ballistic electron emission microscopy studies of a Au/(100)GaAs interface with a native oxide diffusion barrier’’ [Appl. Phys. Lett. 62, 2965 (1993)]
Author(s) -
A. Alec Talin,
Douglas A. A. Ohlberg,
R. Stanley Williams,
P. J. E. Sullivan,
Ioannis Koutselas,
Beth Williams,
K. L. Kavanagh
Publication year - 1994
Publication title -
applied physics letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.182
H-Index - 442
eISSN - 1077-3118
pISSN - 0003-6951
DOI - 10.1063/1.111998
Subject(s) - diffusion , electron microscope , materials science , oxide , condensed matter physics , electron , diffusion barrier , nanotechnology , molecular physics , chemical physics , chemistry , physics , optics , layer (electronics) , quantum mechanics , metallurgy
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