Photorefractive wave mixing in undoped liquid encapsulated Czochralski GaAs at 1.5 μm: Validation of photorefractive modeling
Author(s) -
Philippe Delaye,
L.-A. de Montmorillon,
H. J. von Bardeleben,
G. Roosen
Publication year - 1994
Publication title -
applied physics letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.182
H-Index - 442
eISSN - 1077-3118
pISSN - 0003-6951
DOI - 10.1063/1.111477
Subject(s) - photorefractive effect , mixing (physics) , materials science , absorption (acoustics) , electron , four wave mixing , electron paramagnetic resonance , nonlinear optics , chemistry , optics , optoelectronics , nuclear magnetic resonance , physics , nuclear physics , laser , quantum mechanics , composite material
International audienceWe present photorefractive measurements in undoped GaAs performed at 1.06 pm, 1.32 ,um, and at 1.55 ,um. Using concentrations of EL2 0/+ that we determined through optical absorption and electron paramagnetic resonance measurements in the same sample, we show that a single defect model with an electron-hole competition quantitatively explains our results of photorefractive wave mixing
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