Open AccessErratum: ‘‘Sample current maximum at the critical angle of x-ray total reflection’’ [Appl. Phys. Lett. 63, 269 (1993)]
Author(s) -
Jun Kawai,
Shinjiro Hayakawa,
Setsuo Suzuki,
Yoshinori Kitajima,
Y. Takata,
Teruo Urai,
Kuniko Maeda,
Masanori Fujinami,
Yoshihiro Hashiguchi,
Yohichi Gohshi
Publication year - 1993
Publication title -
applied physics letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.182
H-Index - 442
eISSN - 1077-3118
pISSN - 0003-6951
DOI - 10.1063/1.110816
Subject(s) - total internal reflection , reflection (computer programming) , x ray , current (fluid) , sample (material) , optics , physics , condensed matter physics , materials science , thermodynamics , computer science , programming language
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