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High Tc superconducting YBa2Cu3Ox (YBCO) thin films have been prepared on (305) SrTiO3 (STO) substrates. X‐ray diffraction analysis and Rutherford backscattering experiments reveal that the c‐axis of the layers is directed along the [001] STO axis. Bragg reflection measurements from YBCO lattice planes with high h, k, and l indices confirm that the film growth is epitaxial and almost single domain. For the critical current density jc(77 K) values of 2×106 and 1×103 A/cm2 have been found in the [010] and [501] YBCO directions, respectively

(305) SrTiO3 as substrate for coherently tilted epitaxial YBa2Cu3Ox thin films