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Erratum: Residual strain in epitaxially grown ZnSe/GaAs studied by two-photon absorption spectroscopy [Appl. Phys. Lett. 59, 712 (1991)]
Author(s) -
F. Minami,
Yukio Kato,
Kouji Yoshida,
Kuon Inoue,
Koh Era
Publication year - 1991
Publication title -
applied physics letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.182
H-Index - 442
eISSN - 1077-3118
pISSN - 0003-6951
DOI - 10.1063/1.106370
Subject(s) - epitaxy , absorption (acoustics) , strain (injury) , spectroscopy , materials science , residual , photon , absorption spectroscopy , two photon absorption , optoelectronics , condensed matter physics , optics , physics , nanotechnology , quantum mechanics , laser , mathematics , biology , layer (electronics) , composite material , anatomy , algorithm

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