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Visible photoluminescence of Ge microcrystals embedded in SiO2 glassy matrices
Author(s) -
Yoshihito Maeda,
Nobuo Tsukamoto,
Y. Yazawa,
Yoshihiko Kanemitsu,
Yasuaki Masumoto
Publication year - 1991
Publication title -
applied physics letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.182
H-Index - 442
eISSN - 1077-3118
pISSN - 0003-6951
DOI - 10.1063/1.105773
Subject(s) - photoluminescence , materials science , raman spectroscopy , luminescence , spectroscopy , electron , analytical chemistry (journal) , scanning electron microscope , optoelectronics , optics , chemistry , physics , chromatography , quantum mechanics , composite material
Ge microcrystals embedded in SiO2 glassy matrices were formed by a radio-frequency magnetron cosputtering technique and then annealed at 800 °C for 30 min. The average radius of the Ge microcrystals in SiO2 was determined to be about 3 nm by means of Raman spectroscopy and high resolution electron microscope. The annealed sample showed a strong room temperature luminescence with a peak at 2.18 eV. This is consistent with quantum confinement of electrons and holes

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