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Picosecond absorption dynamics of photoexcited InGaP epitaxial films
Author(s) -
P. Thiagarajan,
J. Schmerge,
Carmen S. Mei,
M. Marconi,
Oscar E. Martínez,
J. J. Rocca,
M. J. Hafich,
H. Y. Lee,
G. Y. Robinson
Publication year - 1991
Publication title -
applied physics letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.182
H-Index - 442
eISSN - 1077-3118
pISSN - 0003-6951
DOI - 10.1063/1.105533
Subject(s) - ambipolar diffusion , picosecond , diffusion , absorption (acoustics) , materials science , epitaxy , attenuation coefficient , fick's laws of diffusion , atmospheric temperature range , analytical chemistry (journal) , laser , optoelectronics , molecular physics , optics , atomic physics , chemistry , plasma , nanotechnology , physics , thermodynamics , layer (electronics) , quantum mechanics , chromatography , composite material , meteorology
The absorption recovery of a photoexcited InGaP epitaxial film 0.4 μm thick was investigated using the pump‐probe laser technique and found to have a time constant of 55 ps at room temperature. Measurements done in the temperature range of 300–50 K show the decay of the photoexcited carrier distribution to be dominated by ambipolar diffusion and surface recombination. The measured absorption recovery time constant corresponds to an ambipolar diffusion coefficient D≳2.8 cm2/s and a surface recombination velocity of S≳4×105 cm/s at room temperature.

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