Local distribution of deep centers in GaP studied by infrared cathodoluminescence
Author(s) -
F. Domı́nguez-Adame,
J. Piqueras,
Paloma Fernández
Publication year - 1991
Publication title -
applied physics letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.182
H-Index - 442
eISSN - 1077-3118
pISSN - 0003-6951
DOI - 10.1063/1.104681
Subject(s) - cathodoluminescence , infrared , scanning electron microscope , materials science , infrared spectroscopy , infrared microscopy , optics , optoelectronics , chemistry , luminescence , physics , organic chemistry , composite material
Near-infrared cathodoluminescence (CL) in the scanning electron microscope has been used to characterize GaP:S. Spectra of as-grown crystals show a broadband at about 1240 nm, probably related to P(Ga) antisite defects. This emission has been found to be higher at dislocations giving a CL image opposite to the visible CL image
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