Thermal fluctuation and 1/f noise in oriented and unoriented Y1Ba2Cu3O7−x films | Zendy

Robert D. Black | Zendy; L. G. Turner | Zendy; A. MogroCampero | Zendy; T. C. McGee | Zendy; AL Robinson | Zendy

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Thermal fluctuation and 1/f noise in oriented and unoriented Y1Ba2Cu3O7−x films

Author(s) -

Robert D. Black,

L. G. Turner,

A. MogroCampero,

T. C. McGee,

AL Robinson

Publication year - 1989

Publication title -

applied physics letters

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 1.182

H-Index - 442

eISSN - 1077-3118

pISSN - 0003-6951

DOI - 10.1063/1.102355

Subject(s) - noise (video) , silicon , materials science , thin film , dielectric , thermal fluctuations , condensed matter physics , thermal , physics , optoelectronics , nanotechnology , thermodynamics , artificial intelligence , computer science , image (mathematics)

We report on electrical noise measurements made on YBCO (Y1 Ba2 Cu3 O7−x ) films on SrTiO3, on bulk silicon with a ZrO2 buffer layer, and on thin dielectric membranes. We have found that 1/f noise predominates in the unoriented films and that thermal fluctuation noise is the chief source of noise in good films on SrTiO3

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