Erratum: Novel optical approach to atomic force microscopy [Appl. Phys. Lett. 5 3, 1045 (1988)]
Author(s) -
Gerhard Meyer,
Nabil M. Amer
Publication year - 1988
Publication title -
applied physics letters
Language(s) - Uncategorized
Resource type - Journals
SCImago Journal Rank - 1.182
H-Index - 442
eISSN - 1077-3118
pISSN - 0003-6951
DOI - 10.1063/1.100425
Subject(s) - atomic force microscopy , materials science , microscopy , optical microscope , nanotechnology , molecular physics , atomic physics , crystallography , chemistry , physics , optics , scanning electron microscope
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