Open AccessPerformance prediction and function recovery of CMOS circuits damaged by Co-60 irradiation
Author(s) -
KueiShu ChangLiao,
JennGwo Hwu
Publication year - 1992
Publication title -
iee proceedings g circuits devices and systems
Language(s) - English
Resource type - Journals
eISSN - 2053-9061
pISSN - 0956-3768
DOI - 10.1049/ip-g-2.1992.0052
Subject(s) - cmos , annealing (glass) , irradiation , amplitude , materials science , electronic circuit , voltage , optoelectronics , electronic engineering , electrical engineering , engineering , physics , optics , nuclear physics , composite material
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