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Evaluating residual errors in waveguide network analysers from microwave to submillimetre-wave frequencies
Author(s) -
Laurence Stant,
N M Ridler,
Peter H. Aaen
Publication year - 2016
Publication title -
surrey open research repository (university of surrey)
Language(s) - English
Resource type - Conference proceedings
DOI - 10.1049/ic.2016.0016
Subject(s) - residual , microwave , waveguide , materials science , optics , computer science , optoelectronics , physics , telecommunications , algorithm
Vector network analysers (VNA) are used extensively for measurements that are made at frequencies ranging from a few kilohertz to at least one terahertz. At radio and microwave frequencies, there are well-established methods for assessing the quality and confidence of these measurements, when they are made in coaxial lines. These methods are usually based on determining the size of residual errors that remain in the VNA after calibration. To date, the performance of these methods has not been investigated in rectangular waveguide, and, at millimetre- and submillimetre-wave frequencies. This paper investigates the application of one of these techniques for waveguide measurements at microwave, millimetre- and submillimetre-wave frequencies. Typical values of residual errors obtained over these frequency ranges are given. These values are considered representative and so can be used by other users of waveguide VNAs to compare with values obtained on their own systems, therefore helping to verify the performance of their systems

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