Wobble-based on-chip calibration circuit for temperature independent oscillators
Author(s) -
Valentijn De Smedt,
Wouter Steyaert,
Wim Dehaene,
Georges Gielen
Publication year - 2012
Publication title -
electronics letters
Language(s) - Uncategorized
Resource type - Journals
SCImago Journal Rank - 0.375
H-Index - 146
eISSN - 1350-911X
pISSN - 0013-5194
DOI - 10.1049/el.2012.1886
Subject(s) - transistor , electronic circuit , calibration , electronic engineering , noise (video) , voltage , materials science , current source , temperature coefficient , optoelectronics , biasing , electrical engineering , chip , computer science , physics , engineering , quantum mechanics , artificial intelligence , image (mathematics)
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