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CMOS low dropout regulator with dynamic zero compensation
Author(s) -
ChiaLi Chen,
WeiJen Huang,
Shiqiang Liu
Publication year - 2007
Publication title -
electronics letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.375
H-Index - 146
eISSN - 1350-911X
pISSN - 0013-5194
DOI - 10.1049/el:20071063
Subject(s) - regulator , low dropout regulator , cmos , compensation (psychology) , dropout (neural networks) , zero (linguistics) , control theory (sociology) , dropout voltage , frequency compensation , electronic engineering , voltage regulator , computer science , engineering , electrical engineering , voltage , control (management) , artificial intelligence , psychology , psychoanalysis , chemistry , biochemistry , gene , philosophy , amplifier , linguistics , machine learning
The output capacitor and its equivalent series resistance (ESR) often limit the stability of a conventional low dropout regulator (LDR). A CMOS LDR with dynamic zero compensation is presented to tolerate the wide range of the output capacitor and the ESR. The stability constraints for the output capacitor with the ESR are derived. The measured LDR is stable for the output capacitor 2nF-47uF with ESR of 0.1-50Omega. The maximum quiescent current of this LDR with a bandgap reference is 43.2uA and its maximum output current is 150 mA for the output voltage of 1.8V.

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