OBDD-based network reliability calculation | Zendy

Fu-Min Yeh | Zendy; SyYen Kuo | Zendy

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OBDD-based network reliability calculation

Author(s) -

Fu-Min Yeh,

SyYen Kuo

Publication year - 1997

Publication title -

electronics letters

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.375

H-Index - 146

eISSN - 1350-911X

pISSN - 0013-5194

DOI - 10.1049/el:19970549

Subject(s) - binary decision diagram , disjoint sets , reliability (semiconductor) , algorithm , exponential function , mathematics , enhanced data rates for gsm evolution , computer science , binary number , discrete mathematics , theoretical computer science , combinatorics , arithmetic , artificial intelligence , mathematical analysis , quantum mechanics , power (physics) , physics

An efficient method for evaluating the terminal-pair reliability based on an edge expansion tree and using an OBDD (ordered binary decision diagram) is presented. The effectiveness of the algorithm is demonstrated on the larger benchmarks collected in previous work. One notable case of the experimental results for a 2×20 lattice network is that the number of nodes in the OBDD is linearly proportional to the number of stages. This is significantly superior to previous algorithms which are based on the sum of disjoint products and has exponential complexity

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