Open AccessSensitive RHEED signature of Ti-excess enabling enhanced cationic composition control during the molecular beam epitaxy of SrTiO3 based solid solutions
Author(s) -
Masoumeh Razaghi Pey Ghaleh,
Marc d’Esperonnat,
Claude Botella,
Sébastien Cueff,
Romain Bachelet,
Guillaume SaintGirons
Publication year - 2021
Publication title -
crystengcomm
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.813
H-Index - 132
ISSN - 1466-8033
DOI - 10.1039/d1ce00013f
Subject(s) - reflection high energy electron diffraction , cationic polymerization , molecular beam epitaxy , materials science , epitaxy , azimuth , analytical chemistry (journal) , crystallography , chemistry , optics , nanotechnology , physics , organic chemistry , layer (electronics) , polymer chemistry
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