An electron beam evaporated TiO2layer for high efficiency planar perovskite solar cells on flexible polyethylene terephthalate substrates | Zendy

Weiming Qiu | Zendy; Ulrich W. Paetzold | Zendy; Robert Gehlhaar | Zendy; Vladimir Smirnov | Zendy; H.G. Boyen | Zendy; Jeffrey G. Tait | Zendy; Bert Conings | Zendy; Weimin Zhang | Zendy; Christian B. Nielsen | Zendy; Iain McCulloch | Zendy; Ludo Froyen | Zendy; Paul Heremans | Zendy; David Cheyns | Zendy

Open Access

An electron beam evaporated TiO₂layer for high efficiency planar perovskite solar cells on flexible polyethylene terephthalate substrates

Author(s) -

Weiming Qiu,

Ulrich W. Paetzold,

Robert Gehlhaar,

Vladimir Smirnov,

H.G. Boyen,

Jeffrey G. Tait,

Bert Conings,

Weimin Zhang,

Christian B. Nielsen,

Iain McCulloch,

Ludo Froyen,

Paul Heremans,

David Cheyns

Publication year - 2015

Publication title -

journal of materials chemistry a

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 3.637

H-Index - 212

eISSN - 2050-7488

pISSN - 2050-7496

DOI - 10.1039/c5ta07515g

Subject(s) - polyethylene terephthalate , materials science , perovskite (structure) , layer (electronics) , planar , cathode ray , optoelectronics , electron , beam (structure) , composite material , optics , chemical engineering , physics , engineering , computer graphics (images) , quantum mechanics , computer science

The TiO2 layer made by electron beam (e-beam) induced evaporation is demonstrated as electron transport layer (ETL) in high efficiency planar junction perovskite solar cells. The temperature of the substrate and the thickness of the TiO2 layer can be easily controlled with this e-beam induced evaporation method, which enables the usage of different types of substrates. Here, Perovskite solar cells based on CH3NH3PbI3-xClx achieve power conversion efficiencies of 14.6% on glass and 13.5% on flexible plastic substrates. The relationship between the TiO2 layer thickness and the perovskite morphology is studied with scanning electron microscope (SEM), atomic force microscope (AFM), and X-ray photoelectron spectroscopy (XPS). Our results indicate that pinholes in thin TiO2 layer lead to pinholes in the perovskite layer. By optimizing the TiO2 thickness, perovskite layers with substantially increased surface coverage and reduced pinhole areas are fabricated, increasing overall device performance

The content you want is available to Zendy users.

Already have an account? Click here to sign in.

Having issues? You can contact us here

Accelerating Research