Evolution of shape, size, and areal density of a single plane of Si nanocrystals embedded in SiO2 matrix studied by atom probe tomography | Zendy

Bin Han | Zendy; Yasuo Shimizu | Zendy; Gabriele Seguini | Zendy; Elisa Arduca | Zendy; Célia Castro | Zendy; Gérard Assayag | Zendy; Koji Inoue | Zendy; Yasuyoshi Nagai | Zendy; Sylvie SchammChardon | Zendy; Michele Perego | Zendy

Open Access

Evolution of shape, size, and areal density of a single plane of Si nanocrystals embedded in SiO₂ matrix studied by atom probe tomography

Author(s) -

Bin Han,

Yasuo Shimizu,

Gabriele Seguini,

Elisa Arduca,

Célia Castro,

Gérard Assayag,

Koji Inoue,

Yasuyoshi Nagai,

Sylvie SchammChardon,

Michele Perego

Publication year - 2015

Publication title -

rsc advances

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.746

H-Index - 148

ISSN - 2046-2069

DOI - 10.1039/c5ra26710b

Subject(s) - atom probe , transmission electron microscopy , nanocrystal , materials science , area density , atom (system on chip) , plane (geometry) , tomography , molecular physics , matrix (chemical analysis) , electron tomography , electron density , crystallography , electron , optics , nanotechnology , scanning transmission electron microscopy , geometry , chemistry , physics , composite material , mathematics , quantum mechanics , computer science , embedded system

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