Detection and characterization of nanoparticles in suspension at low concentrations using the X-ray total scattering pair distribution function technique
Author(s) -
Maxwell W. Terban,
Matthew N. Johnson,
Marco Di Michiel,
Simon J. L. Billinge
Publication year - 2015
Publication title -
nanoscale
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 2.038
H-Index - 224
eISSN - 2040-3372
pISSN - 2040-3364
DOI - 10.1039/c4nr06486k
Subject(s) - characterization (materials science) , suspension (topology) , nanoparticle , materials science , scattering , pair distribution function , function (biology) , x ray , distribution function , distribution (mathematics) , small angle x ray scattering , nanotechnology , analytical chemistry (journal) , optics , chemistry , chromatography , physics , mathematics , thermodynamics , mathematical analysis , biology , evolutionary biology , homotopy , pure mathematics
Difference atomic pair distribution function methods have been applied to detect and characterize nanoparticles suspended in a solvent at very dilute concentrations. We specifically consider nanoparticles of a pharmaceutical compound in aqueous solution using X-ray PDF methods, a challenging case due to the low atomic number of the nanoparticle species. The nanoparticles were unambiguously detected at the level of 0.25 wt%. Even at these low concentrations the signals were highly reproducible, allowing for reliable detection and quantitative analysis of the nanoparticle structure.
Accelerating Research
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom
Address
John Eccles HouseRobert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom