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Detection and characterization of nanoparticles in suspension at low concentrations using the X-ray total scattering pair distribution function technique
Author(s) -
Maxwell W. Terban,
Matthew N. Johnson,
Marco Di Michiel,
Simon J. L. Billinge
Publication year - 2015
Publication title -
nanoscale
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 2.038
H-Index - 224
eISSN - 2040-3372
pISSN - 2040-3364
DOI - 10.1039/c4nr06486k
Subject(s) - characterization (materials science) , suspension (topology) , nanoparticle , materials science , scattering , pair distribution function , function (biology) , x ray , distribution function , distribution (mathematics) , small angle x ray scattering , nanotechnology , analytical chemistry (journal) , optics , chemistry , chromatography , physics , mathematics , thermodynamics , mathematical analysis , biology , evolutionary biology , homotopy , pure mathematics
Difference atomic pair distribution function methods have been applied to detect and characterize nanoparticles suspended in a solvent at very dilute concentrations. We specifically consider nanoparticles of a pharmaceutical compound in aqueous solution using X-ray PDF methods, a challenging case due to the low atomic number of the nanoparticle species. The nanoparticles were unambiguously detected at the level of 0.25 wt%. Even at these low concentrations the signals were highly reproducible, allowing for reliable detection and quantitative analysis of the nanoparticle structure.

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