Optical absorption phenomena at electrode surfaces
Author(s) -
Julian F. Tyson,
T.S. West
Publication year - 1974
Publication title -
nature
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 15.993
H-Index - 1226
eISSN - 1476-4687
pISSN - 0028-0836
DOI - 10.1038/250139a0
Subject(s) - specular reflection , reflection (computer programming) , ellipsometry , optics , materials science , interferometry , absorption (acoustics) , total internal reflection , spectroscopy , holography , electrode , holographic interferometry , microscopy , optoelectronics , thin film , chemistry , nanotechnology , physics , computer science , quantum mechanics , programming language
THERE has been a considerable expansion recently, in the application of optical techniques, such as internal reflection and specular reflection spectroscopy, ellipsometry, interferometry, holography and optical microscopy, to the study of adsorption phenomena in electrochemical reactions1–3.
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