Growth of nanotubes for probe microscopy tips | Zendy

Jason H. Hafner | Zendy; Chin Li Cheung | Zendy; Charles M. Lieber | Zendy

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Growth of nanotubes for probe microscopy tips

Author(s) -

Jason H. Hafner,

Chin Li Cheung,

Charles M. Lieber

Publication year - 1999

Publication title -

nature

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 15.993

H-Index - 1226

eISSN - 1476-4687

pISSN - 0028-0836

DOI - 10.1038/19658

Subject(s) - carbon nanotube , nanotechnology , materials science , nanotube , microscopy , chemical vapor deposition , atomic force microscopy , scanning probe microscopy , fabrication , limiting , silicon , resolution (logic) , optics , optoelectronics , physics , medicine , mechanical engineering , alternative medicine , engineering , pathology , artificial intelligence , computer science

Carbon nanotubes, which have intrinsically small diameters and high aspect ratios and which buckle reversibly, make potentially ideal structures for use as tips in scanning probe microscopies, such as atomic force microscopy (AFM)1, 2, 3, 4. However, the present method of mechanically attaching nanotube bundles for tip fabrication is time consuming and selects against the smallest nanotubes, limiting the quality of tips. We have developed a technique for growing individual carbon nanotube probe tips directly, with control over the orientation, by chemical vapour deposition (CVD) from the ends of silicon tips. Tips grown in this way may become widely used in high-resolution probe microscopy imaging.

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