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Ultranarrow Luminescence Linewidth of Silicon Nanocrystals and Influence of Matrix
Author(s) -
Ilya Sychugov,
Anna Fučíková,
Federico Pevere,
Zhenyu Yang,
Jonathan G. C. Veinot,
Jan Linnros
Publication year - 2014
Publication title -
acs photonics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 2.735
H-Index - 89
ISSN - 2330-4022
DOI - 10.1021/ph500221z
Subject(s) - laser linewidth , materials science , nanocrystal , quantum dot , luminescence , optoelectronics , passivation , silicon , photoluminescence , phosphor , silicon dioxide , nanotechnology , layer (electronics) , optics , laser , physics , metallurgy
The luminescence linewidth of individual silicon nanocrystals was characterized by single-dot spectroscopy, and an ultranarrow linewidth of similar to 200 mu eV at 10 K was found. This value is, in fact, limited by system resolution and represents only the upper limit of the homogeneous linewidth. In addition, the effect of the matrix was investigated for nanocrystals coated with organic ligands, embedded in silicon dioxide, as well as for nanocrystals with only a thin passivating layer. It was found that, depending on the matrix, the room-temperature bandwidth may vary by an order of magnitude, where values as small as similar to 12 meV (similar to 5 nm) at 300 K were detected for nanocrystals with a thin passivation. The observed values for silicon nanocrystals are similar and even surpass some of those for direct-band-gap quantum dots. The narrow linewidth at room temperature enables the use of silicon nanocrystals for nontoxic narrow-band labeling of biomolecules and for application as phosphors in white-light-emitting devices.

QC 20141114

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