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Scaling Properties in Transistors That Use Aligned Arrays of Single-Walled Carbon Nanotubes
Author(s) -
Xinning Ho,
Lina Ye,
Slava V. Rotkin,
Qing Cao,
Sakulsuk Unarunotai,
Shuaib Salamat,
Muhammad A. Alam,
John A. Rogers
Publication year - 2010
Publication title -
nano letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 4.853
H-Index - 488
eISSN - 1530-6992
pISSN - 1530-6984
DOI - 10.1021/nl903281v
Subject(s) - ohmic contact , materials science , carbon nanotube , contact resistance , transistor , optoelectronics , nanotechnology , semiconductor , scaling , voltage , electrical engineering , geometry , mathematics , engineering , layer (electronics)
Recent studies and device demonstrations indicate that horizontally aligned arrays of linearly configured single-walled carbon nanotubes (SWNTs) can serve as an effective thin film semiconductor material, suitable for scalable use in high-performance transistors. This paper presents the results of systematic investigations of the dependence of device properties on channel length, to reveal the role of channel and contact resistance in the operation. The results indicate that, for the range of channel lengths and SWNT diameters studied here, source and drain contacts of Pd yield transistors with effectively Ohmic contacts that exhibit negligible dependence of their resistances on gate voltage. For devices that use Au, modulation of the resistance of the contacts represents a significant contribution to the response. Extracted values of the mobilities of the semiconducting SWNTs and the contact resistances associated with metallic and semiconducting SWNTs are consistent with previous reports on single tube test structures.

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